Scan Vector Compression/Decompression Using Statistical Coding
نویسندگان
چکیده
A compression/decompression scheme based on statistical coding is presented for reducing the amount of test data that must be stored on a tester and transferred to each core in a core-based design. The test vectors provided by the core vendor are stored in compressed form in the tester memory and transferred to the chip where they are decompressed and applied to the core. Given the set of test vectors for a core, a statistical code is carefully selected so that it satisfies certain properties. These properties guarantee that it can be decoded by a simple pipelined decoder (placed at the serial input of the core’s scan chain) which requires very small area. Results indicate that the proposed scheme can use a simple decoder to provide test data compression near that of an optimal Huffman code. The compression results in a two-fold advantage since both test storage and test time are reduced.
منابع مشابه
Test data compression and decompression based on internal scan chains and golomb coding - Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
We present a data compression method and decompression architecture for testing embedded cores in a system-on-a-chip (SOC). The proposed approach makes effective use of Golomb coding and the internal scan chain(s) of the core under test and provides significantly better results than a recent compression method that uses Golomb coding and a separate cyclical scan register (CSR). The major advant...
متن کاملTest data compression and decompression based on internal scanchains and Golomb coding
We present a data compression method and decompression architecture for testing embedded cores in a system-on-a-chip (SOC). The proposed approach makes effective use of Golomb coding and the internal scan chain(s) of the core under test, and provides significantly better results than a recent compression method that uses Golomb coding and a separate cyclical scan register (CSR). The major advan...
متن کاملAn efficient test vector compression scheme using selective Huffman coding
This paper presents a compression/decompression scheme based on selective Huffman coding for reducing the amount of test data that must be stored on a tester and transferred to each core in a system-on-a-chip (SOC) during manufacturing test. The test data bandwidth between the tester and the SOC is a bottleneck that can result in long test times when testing complex SOCs that contain many cores...
متن کاملLow-power scan testing and test data compression forsystem-on-a-chip
Test data volume and power consumption for scan vectors are two major problems in system-on-a-chip testing. Since static compaction of scan vectors invariably leads to higher power for scan testing, the conflicting goals of low-power scan testing and reduced test data volume appear to be irreconcilable. We tackle this problem by using test data compression to reduce both test data volume and sc...
متن کاملAlternating Frequency-Directed Equal-Run-Length Coding
This chapter presents a new encoding scheme called alternating frequency-directed equal-run-length (AFDER) coding for test data compression. This encoding scheme together with nine-coded compression technique enhance the test data compression ratio. In the first stage, the pre-generated test cubes with unspecified bits are encoded using nine-coded compression scheme. Later, the proposed encodin...
متن کامل